Precision Measurement and Control Laboratory
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Precision Measurement and Control Laboratory
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About PMCL
Welcome to Precision Measurement and Control Laboratory!
Our research has focused on mathematical modeling and physical understanding of the dynamics of mechanical and electromechanical systems and of the physical interaction central to force sensing and motion measurement. We have then used mathematical models, sensing techniques, and engineering principles to design and realize novel engineering systems and one-of-a-kind measurement instruments, and used state-of-the-art control techniques and electronics to achieve superior performance. Specific application areas include precision engineering and manufacturing, nanometrology and nanomanipulation, laser trapping and photonic force microscopy, and imaging and mechanical characterization of metastatic cancer cells. Our research has been supported primarily by the National Science Foundation (NSF), National Institutes of Health (NIH), Air Force Research Laboratories, Ohio Board of Regents, and industry.
Accordions
Sponsors
- National Science Foundation
- National Institutes of Health
- GUIde Consortium
- Air Force Research Laboratories
- ALCOA
- The L. S. Starrett Company
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Useful Resources
- Codeguru
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- The Geometry Center
- CMU Computer Vision
- OSU Object Model
- OSU Reange Images
- Cheng, P., Jhiang, S.M., and Menq, C. H., “A real-time visual sensing system achieving high-speed 3-D particle tracking with nanometer resolution,” Applied Optics, Vol. 52, No. 31, pp. 7530-7539, 1 November 2013.
- Liu, Z., Jeong, Y., and Menq, C. H., “Calibration of measurement sensitivities of multiple micro-cantilever dynamic modes in atomic force microscopy using a contact detection method,” Review of Scientific Instruments, Vol. 84, 023703 (2013).
- Cheng, P. and Menq, C. H., “Cancelling Bias Induced by Correlation Coefficient Interpolation for Ultra-Precise Sub-pixel Image Registration,” Meas. Sci. Technol. 24 (2013) 035404 (10pp).
- Cheng, P. and Menq, C. H., “Real-time Continuous Image Registration Enabling Ultra-precise Two-dimensional Motion Tracking,” IEEE Transactions on Image Processing, Vol. 22, No. 5, pp. 2081-2090, 2013.
- Zhang, Z., Long, F., and Menq, C. H., “Three-Dimensional Visual Servo Control of a Magnetically Propelled Microscopic Bead,” IEEE Transactions on Robotics, Vol. 29, No. 2, pp. 373-382, April 2013.
- Jayanth, GR. and Menq, C. H., “Two-Axis Force Sensing and Control of a Re-orientable Scanning Probe,” IEEE/ASME Transactions on Mechatronics, Vol. 18, No. 2, pp. 687-696, April 2013.
- Jayanth, GR. and Menq, C. H., “Tip Motion Control and Scanning of a Reorientable Micromanipulator with Axially-located Tip,” IEEE/ASME Transactions on Mechatronics, Vol. 17, No. 5, pp. 801-810, October 2012.
- Huang, Y., Cheng, P. and Menq, C. H., “Dynamic Force Sensing Using an Optically Trapped Probing System,” IEEE/ASME Transactions on Mechatronics, Vol. 16, No. 6, pp. 1145-1154, December 2011.
- Chen, I-M, Benbouzid, M, Ding, H, Kim, W-J, Menq, C.H., “Guest Editorial: Introduction to the Focused Section on Electromagnetic Devices for Precision Engineering,” IEEE/ASME Transactions on Mechatronics, Vol. 16, No. 3, pp. 401-410, June 2011.
- Zhang, Z. and Menq, C. H., “Design and Modeling of a 3D Magnetic Actuator for Magnetic Microbead Manipulation”, IEEE/ASME Transactions on Mechatronics, Vol. 16, No. 3, pp. 421-430, June 2011.
- Zhang, Z., Huang, Y., and Menq, C. H., “Actively Controlled Manipulation of a Magnetic Microbead using Quadrupole Magnetic Tweezers”, IEEE Transactions on Robotics, Vol. 26, No. 3, pp. 531-541, June 2010.
- Zhang, Z., Huang, K., and Menq, C. H., “Design, Implementation, and Force Modeling of Quadruple Magnetic Tweezer”, IEEE/ASME Transactions on Mechatronics, Vol. 15, Issue 5, pp. 704-713, October 2010.
- Jayanth, GR. and Menq, C. H., “Control of a Two-Axis Micromanipulator-based Scanning Probe System for 2.5D Nanometrology,” IEEE/ASME Transactions on Mechatronics, Vol. 15, Issue 5, pp. 661-670, October 2010.
- Jeong, Y., Jayanth, GR., Jhiang, S., and Menq, C. H., “Design and Fabrication of an Active Multi-axis Probing System for High Speed Atomic Force Microscopy,” IEEE Transactions on Nanotechnology, Vol. 9, No. 3, pp. 392-399, May 2010.
- Jayanth, GR. and Menq, C. H., “Modeling and Design of a Magnetically Actuated Two-Axis Compliant Micromanipulator for Nano-manipulation,” IEEE/ASME Transactions on Mechatronics, Vol. 15, Issue 3, pp. 360-370, June 2010.
- Huang, Y., Zhang, Z., and Menq, C. H., "Minimum-variance Brownian motion control of an optically trapped probe," Appl. Opt.48, 5871-5880 (2009)
- Wan. J, Huang, Y., Jhiang, S. M. and Menq, C. H. "Real-time in situ calibration of an optically trapped probing system," Applied Optics, Vol. 48, Iss. 25, pp. 4832-4841, 2009
- Huang, Y., Wan, J., Cheng, M. C., Zhang, Z., Jhiang, S. M. and Menq, C. H. "Three-axis rapid steering of optically propelled micro/nano particles, " Review of Scientific Instruments, Vol.80, pp. 063107, 2009
- Zhang, Z. and Menq, C.-H. “Best linear unbiased axial localization in three-dimensional fluorescent bead tracking with subnanometer resolution using off-focus images,” J. Opt. Soc. Am. A, vol. 26, pp. 1484-1493, 2009.
- Kim, J. and Menq C. H., 2009, “Visual Servo Control Achieving Nanometer Resolution in X-Y-Z,” IEEE Transactions on Robotics, Vol. 25, No. 1, February 2009, pp. 109-116.
- Zhang, Z. and Menq C. H., 2008, “Three-Dimensional particle tracking with subnanometer resolution using off-focus images,” Applied Optics, Vol. 47, No. 13, pp. 2361-2370, 1 May 2008.
- Hu, K., Kim, J., Schmiedeler, J., and Menq C. H., 2008, “Design, Implementation, and Control of a Six-Axis Compliant Stage”, Review of Scientific Instruments, Vol. 79, 025105 (2008); also published in the March 3, 2008 issue of Virtual Journal of Nanoscale Science & Technology.
- Jayanth, GR., Jhiang, S., and Menq, C. H., 2008, "Two-axis probing system for Atomic Force Microscopy", Review of Scientific Instruments, Vol. 79, 023705 (2008); also published in the February 25, 2008 issue of Virtual Journal of Nanoscale Science & Technology.
- Kim, J. and Menq C. H., 2008 “Visually Servoed 3D Alignment of Multiple Objects with Sub-Nanometer Precision “, IEEE Transactions on Nanotechnology, Vol. 7, No. 3, May 2008, pp. 321-330.
- Jeong, Y., Jayanth, GR., and Menq C. H., 2007, “Control of tip-to-sample distance in atomic force microscopy: a dual-actuator tip-motion control scheme,” Review of Scientific Instruments, Vol. 78, 093706 (2007); also published in the October 8, 2007 issue of Virtual Journal of Nanoscale Science & Technology.
- Zhang, Z. and Menq C. H., 2007, “Design and Development of a Six-axis Interferometric Measurement System”, Review of Scientific Instruments, Vol. 78, 083107 (2007).
- Zhang, Z. and Menq C. H., 2007, “Six-axis Magnetic Levitation and Motion Control”, IEEE Transactions on Robotics, Vol. 23, No. 2, April 2007, pp. 196-205.
- Huang, Y. and Menq C. H., 2006, “Design and Development of a Large Range Linear Encoder with Subnanometer Resolution,” Review of Scientific Instruments, Vol. 77, 105104 (2006).
- Jeong, Y., Jayanth, GR., Jhiang, S., and Menq, C. H., 2006, “Direct tip-sample interaction force control for the dynamic mode atomic force microscopy”, Applied Physics Letters, Vol. 88, 204102 (2006).
Director
Contact
Postal Address:
The Ohio State University
Suite N350 Scott Lab
201 West 19th Avenue
Columbus, OH 43210
Telephone: 614-292-8718 (RmW387), 614-292-2032 (W096)
FAX: 614-292-3163
Emails:
Professor: menq.1@osu.edu
Webmaster: jeong.49@.osu.edu